• ESD TR5.4-03-11
Provide PDF Format

Learn More

ESD TR5.4-03-11

  • ESD Association Technical Report For Electrostatic Discharge Sensitivity Testing - Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits, Transient Latch-up Testing - Component Level, Supply Transient Stimulation
  • Report / Survey by Electrostatic Discharge Association, 2011
  • Publisher: ESD

$9.00$18.00


The information and procedures defined in this technical report may be used to search for latch-up sensitive layouts within integrated circuits. The stress levels and stimuli parameter values defined may be used for a wide range of devices. Levels and values can be scaled up or down to suit the requirements of the actual device under test and types of transient stimuli being used.

Related Products

ESD STM9.1-2006

ESD STM9.1-2006

Footwear-Resistive Characterization..

$26.00 $51.00

ESD STM97.2-2006

ESD STM97.2-2006

Floor Materials and Footwear- Voltage Measurement in Combination with a Person..

$68.00 $135.00

ESD JS-001-2011

ESD JS-001-2011

ESDA/JEDEC Joint Standard for Electrostatic Testing, Human Body Modal (HBM) - Component Level..

$65.00 $129.00

ESD SP14.5-2015

ESD SP14.5-2015

ESD Association Standard Practice for Electrostatic Discharge Sensitivity Testing - Near Field Immun..

$68.00 $135.00