Provide PDF Format
JEDEC EIA 318-B
- MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
- standard by JEDEC Solid State Technology Association, 07/01/1996
- Publisher: JEDEC
$30.00$59.00
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.
Related Products
JEDEC JESD51-11
TEST BOARDS FOR THROUGH-HOLE AREA ARRAY LEADED PACKAGE THERMAL MEASUREMENT..
$30.00 $59.00
JEDEC JESD22-A120B
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS US..
$28.00 $56.00
JEDEC JESD 24-5 (R2002)
ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHOD..
$24.00 $48.00