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JEDEC JEB 15
- TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
- standard by JEDEC Solid State Technology Association, 11/01/1969
- Publisher: JEDEC
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This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.
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