• Your shopping cart is empty!

  • JEDEC EIA 323 (R2002)
Provide PDF Format

Learn More

JEDEC EIA 323 (R2002)

  • AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
  • standard by JEDEC Solid State Technology Association, 03/01/1966
  • Publisher: JEDEC

$26.00$51.00


This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Product Details

Published:
03/01/1966
Number of Pages:
9
File Size:
1 file , 300 KB

Related Products

JEDEC JESD96A

JEDEC JESD96A

RADIO FRONT END - BASEBAND (RF-BB) INTERFACE..

$53.00 $106.00

JEDEC JEP160

JEDEC JEP160

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices..

$34.00 $67.00

JEDEC JESD22-B106D

JEDEC JESD22-B106D

RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES..

$27.00 $53.00

JEDEC JESD63

JEDEC JESD63

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPER..

$39.00 $78.00