Provide PDF Format
JEDEC JESD 353 (R2009)
- THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD
- standard by JEDEC Solid State Technology Association, 04/01/1968
- Publisher: JEDEC
$26.00$51.00
This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.
Related Products
JEDEC JESD3-C
STANDARD DATA TRANSFER FORMAT BETWEEN DATA PREPARATION SYSTEM AND PROGRAMMABLE LOGIC DEVICE PROGRAMM..
$39.00 $78.00
