Provide PDF Format
JEDEC JESD22-A100D
- CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
- standard by JEDEC Solid State Technology Association, 07/01/2013
- Publisher: JEDEC
$27.00$53.00
The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages(e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
The Cycled Temperature-humidity "Biased Life Test is performed for the purpose of evaluating thereliability of non-hermetic, packaged solid state devices in humidity environments when surfacecondensation is likely. It employs conditions of bias, temperature cycling and high humidity that willcause condensation to occur on the device surface. It is useful to determine device surface susceptibilityto corrosion and/or dendritic growth.
For most applications test method JESD22-A110 "Highly Accelerated Temperature and Humidity StressTest (HAST)" or JESD22-A101 "Steady State Temperature, Humidity, Biased Life Test" is preferred.
The Cycled Temperature-humidity "Biased Life Test is performed for the purpose of evaluating thereliability of non-hermetic, packaged solid state devices in humidity environments when surfacecondensation is likely. It employs conditions of bias, temperature cycling and high humidity that willcause condensation to occur on the device surface. It is useful to determine device surface susceptibilityto corrosion and/or dendritic growth.
For most applications test method JESD22-A110 "Highly Accelerated Temperature and Humidity StressTest (HAST)" or JESD22-A101 "Steady State Temperature, Humidity, Biased Life Test" is preferred.
Related Products
JEDEC JESD70
2.5 V BiCMOS LOGIC DEVICE FAMILY SPECIFICATION WITH 5 V TOLERANT INPUTS AND OUTPUTS..
$27.00 $53.00
JEDEC JEP150.01
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SUR..
$34.00 $67.00
JEDEC JS709B
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products..
$30.00 $59.00