• JEDEC JESD22-A122
Provide PDF Format

Learn More

JEDEC JESD22-A122

  • POWER CYCLING
  • standard by JEDEC Solid State Technology Association, 08/01/2007
  • Publisher: JEDEC

$30.00$59.00


This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component, simulating the non-uniform temperature distribution resulting from a device powering on and off in the application.

Related Products

JEDEC JESD22-A117C

JEDEC JESD22-A117C

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST..

$31.00 $62.00

JEDEC JESD8-24

JEDEC JESD8-24

POD12-1.2 V Pseudo Open Drain Interface..

$142.00 $284.00

JEDEC JESD75-3

JEDEC JESD75-3

BALL GRID ARRAY PINOUTS STANDARDIZED FOR 8-BIT LOGIC FUNCTIONS..

$24.00 $47.00

JEDEC JESD22-B106D

JEDEC JESD22-B106D

RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES..

$27.00 $53.00