Provide PDF Format

JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/2001
Publisher: JEDEC

$27.00$54.00

Description

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:: 09/01/2001
Number of Pages:: 14
File Size:: 1 file , 55 KB

Related Products

JEDEC JESD22-A122A

Power Cycling..

$30.00 $60.00

JEDEC JESD220A

Universal Flash Storage (UFS)..

$178.00 $355.00

JEDEC JESD82-10A

DEFINITION OF THE SSTU32866 1.8 V CONFIGURABLE REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICAT..

$40.00 $80.00

JEDEC JESD70

2.5 V BiCMOS LOGIC DEVICE FAMILY SPECIFICATION WITH 5 V TOLERANT INPUTS AND OUTPUTS..

$27.00 $53.00