Provide PDF Format
JEDEC JESD47H
- STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
- standard by JEDEC Solid State Technology Association, 02/01/2011
- Publisher: JEDEC
$34.00$67.00
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
Related Products
JEDEC JESD22-A100-A
Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity..
$47.00 $93.00
JEDEC JESD51-51
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impe..
$36.00 $72.00
JEDEC JEP139
GUIDELINE FOR CONSTANT TEMPERATURE AGING TO CHARACTERIZE ALUMINUM INTERCONNECT METALLIZATIONS FOR ST..
$30.00 $59.00