Provide PDF Format
JEDEC JESD6 (R2002)
- MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
- standard by JEDEC Solid State Technology Association, 02/01/1967
- Publisher: JEDEC
$30.00$59.00
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Related Products
JEDEC JEP128
GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING..
$26.00 $51.00
JEDEC JESD8-4
ADDENDUM No. 4 to JESD8 - CENTER-TAP-TERMINATED (CTT) INTERFACE LOW-LEVEL, HIGH-SPEED INTERFACE STAN..
$24.00 $48.00
