• JEDEC JESD51-9
Provide PDF Format

Learn More

JEDEC JESD51-9

  • TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS
  • standard by JEDEC Solid State Technology Association, 07/01/2000
  • Publisher: JEDEC

$30.00$60.00


This standard covers the design of printed circuit boards (PCBs) used in the thermal characterization of ball grid array (BGA) and land grid array (LGA) packages. It is intended to be used in conjunction with the JESD51 series of standards that cover the test methods and test environments. JESD51-9 was developed to give a figure-of-merit of thermal performance that allows for accurate comparisons of packages from different suppliers. It can be used to give a first order approximation of system performance and, in conjunction with the other JESD51 PCB standards, allows for comparisons of the various package families.

Related Products

JEDEC JESD63

JEDEC JESD63

STANDARD METHOD FOR CALCULATING THE ELECTROMIGRATION MODEL PARAMETERS FOR CURRENT DENSITY AND TEMPER..

$39.00 $78.00

JEDEC JESD 471 (R2009)

JEDEC JESD 471 (R2009)

SYMBOL AND LABEL FOR ELECTROSTATIC SENSITIVE DEVICES..

$24.00 $48.00

JEDEC JESD 35-2

JEDEC JESD 35-2

ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS..

$27.00 $54.00

JEDEC JESD235A

JEDEC JESD235A

HIgh Bandwidth Memory (HBM) DRAM..

$104.00 $208.00