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JEDEC JESD89-3A
- TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
- standard by JEDEC Solid State Technology Association, 11/01/2007
- Publisher: JEDEC
$36.00$72.00
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.
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