Provide PDF Format
JEDEC JP001.01
- FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
- standard by JEDEC Solid State Technology Association, 05/01/2004
- Publisher: JEDEC
$44.00$87.00
This document provides a guideline for the minimum set of measurements to qualify a new semiconductor wafer process. It is written with particular reference to a generic silicon based CMOS logic technology. While it may be applicable to other technologies (e.g. analog CMOS, bipolar, BICMOS, GaAs, etc.), some sections apply specifically to CMOS. No effort was made in the present document to cover all the qualification requirements for specific other technologies, e.g. Cu/Low K interconnects or ultra thin gate oxide. This publication, is co-sponsored by JEDEC JC-14.2 and the FSA (Fabless Semiconductor Association). It originated at the FSA as a technology specific document, and has evolved into a generic set of qualification requirements.
Related Products
JEDEC JESD22-A100-A
Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity..
$47.00 $93.00
JEDEC JEB 15
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS..
$71.00 $141.00
