JEDEC

JEDEC

JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.


JEDEC JESD51-5

JEDEC JESD51-5

EXTENSION OF THERMAL TEST BOARD STANDARDS FOR PACKAGES WITH DIRECT THERMAL ATTACHMENT MECHANISMS

$24.00 $48.00

JEDEC JESD51-50

JEDEC JESD51-50

Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-P

$27.00 $53.00

JEDEC JESD51-51

JEDEC JESD51-51

Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impe

$36.00 $72.00

JEDEC JESD51-52

JEDEC JESD51-52

Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with

$30.00 $59.00

JEDEC JESD51-53

JEDEC JESD51-53

TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING

$28.00 $56.00

JEDEC JESD51-6

JEDEC JESD51-6

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS - FORCED CONVECTION (MOVING AIR)

$24.00 $48.00

JEDEC JESD51-7

JEDEC JESD51-7

HIGH EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES

$27.00 $53.00

JEDEC JESD51-8

JEDEC JESD51-8

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS - JUNCTION-TO-BOARD

$28.00 $56.00

JEDEC JESD51-9

JEDEC JESD51-9

TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS

$30.00 $60.00

JEDEC JESD52

JEDEC JESD52

STANDARD FOR DESCRIPTION OF LOW VOLTAGE TTL-COMPATIBLE CMOS LOGIC DEVICES

$28.00 $56.00

JEDEC JESD531 (R2002)

JEDEC JESD531 (R2002)

THERMAL RESISTANCE TEST METHOD FOR SIGNAL AND REGULATOR DIODES (FORWARD VOLTAGE, SWITCHING METHOD)

$30.00 $59.00

JEDEC JESD54

JEDEC JESD54

STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES

$39.00 $78.00

JEDEC JESD55

JEDEC JESD55

STANDARD FOR DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE BiCMOS LOGIC DEVICES

$31.00 $62.00

JEDEC JESD557C

JEDEC JESD557C

STATISTICAL PROCESS CONTROL SYSTEMS

$37.00 $74.00

JEDEC JESD57

JEDEC JESD57

TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IR

$44.00 $87.00

Showing 316 to 330 of 463 (31 Pages)